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Research Solutions
Nanoscale Surface Metrology

Universities, government research laboratories, and private R&D groups have trusted Nanoscience Instruments' products to support their research. We have a focus on scanning probe microscopy, but supplie products useful in the same research environments.

Modular Atomic Force Microscopy

Modular Atomic Force Microscopy
Modular and easy to use AFMs can be configured for a wide variety of research.

PLL for noncontact AFM
Electronics to properly control and detect an AFM sensor for UHV AFM, MFM, & NSOM.
Q Control for AFM
Improve resolution and reduce contact forces in your AFM

SPIP data analysis software
Powerful data analysis software

Powerful data analysis software
Full suite of analysis functions for batch processing, creating dramatic reports and 3D rendering.

AFM Probes
More info about industrial AFM probes

AFM Probes
Probes for virtually any research application.
Chemicals for surface modifications
Thiols and Dithiols for surface and AFM probe functionalization.