Research Solutions
Nanoscale Surface Metrology

Universities, government research laboratories, and private R&D groups have trusted Nanoscience Instruments' products to support their research. We have a focus on scanning probe microscopy, but supplie products useful in the same research environments.

	Modular Atomic Force Microscopy Modular and easy to use AFMs can be configured for a wide variety of research.		PLL for noncontact AFM Electronics to properly control and detect an AFM sensor for UHV AFM, MFM, & NSOM.
	Q Control for AFM Improve resolution and reduce contact forces in your AFM		Powerful data analysis software Full suite of analysis functions for batch processing, creating dramatic reports and 3D rendering.
	AFM Probes Probes for virtually any research application.		Chemicals for surface modifications Thiols and Dithiols for surface and AFM probe functionalization.