Research Solutions
Nanoscale Surface Metrology

Universities, government research laboratories, and private R&D groups have trusted Nanoscience Instruments' products to support their research. We have a focus on scanning probe microscopy, but supplie products useful in the same research environments.

	Modular Atomic Force Microscopy Modular and easy to use AFMs can be configured for a wide variety of research.		Carbon Nanotube Furnace Benchtop CNT furnace is low cost and easy to use. Perfect for education or personal research.
	3D Optical Microscope and Profiler True color 3D imaging, high roughness, high aspect ratio samples, fast measurements.		Powerful data analysis software Full suite of analysis functions for batch processing, creating dramatic reports and 3D rendering.
	Q Control for AFM Improve resolution and reduce contact forces in your AFM		PLL for noncontact AFM Electronics to properly control and detect an AFM sensor for UHV AFM, MFM, & NSOM.