Nanoscience Instruments, Inc.

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News

Join us at Microscopy & Microanalysis 2014!
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Nanoscience Instruments Announces Exclusive New Line of Scanning Probe Microscopes
Nanoscience Instruments, an industry leader providing scientific instruments to investigate the micro- and nanoscale world, is pleased to announce a new line of scanning probe microscopes: the traxAFM and traxSTM systems…
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Video Recording for our Hands-on Webinar
The recording is now posted in our Education section under Resources/Multimedia
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Nanoscience Instruments Expands East to Open New Office and Lab in Washington DC Area
Nanoscience Instruments, an industry leader providing scientific instruments to investigate the micro- and nanoscale world, is pleased to announce the opening of an east coast office and the expansion of the Phoenix, AZ …
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Announcing the Nanoscience Instruments New England and Eastern NY Tour
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Nanoscience Instruments Announces miBot tour in Illinois
Nano/micro manipulation solutions for light and electron microscopy tools.
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An Educational Webinar: Hands-On in a Nanotechnology Classroom
Nanoscience Instruments in hosting an educational webinar on April 3, 2014 from 11AM-12PM EDT.
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Announcing the Nanoscience Instruments Midwest Tour in Madison WI
Nanoscience Instruments will be on tour to meet with you.
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New ParticleMetric Software Available for SEM
New ParticleMetric Software from Phenom-World now available from Nanoscience Instruments
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Join us at Pittcon!
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New Generation of Desktop SEMs announced
With a magnification range up to 100,000x and resolution better than 17nm, the Phenom Pro is the most powerful desktop SEM ever. Not only does the Phenom provide remarkable clarity and detail with high magnification, i…
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Nanoscience Classroom installed at Wheeling High
Wheeling High School selects Nanoscience Instruments' NanoClassroom to launch new nano program.
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miBot Nanomanipulator from Imina Technologies
The miBot is a mobile micro-robot for carrying out various nanomanipulation, probing and sensing tasks under optical microscopes and in SEM/FIB chambers. Virtually untethered, it is free to move independently, enabling i…
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New Integrated AFM & Optical Profiler system
A new multi-technique microscope integrates atomic force microscopy and advanced optical profilometry. The unique system combination provides an extremely wide range of metrology capabilities, unmatched by any other inst…
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Phenom Desktop SEM Available from Nanoscience Instruments
Nanoscience Instruments today announced the exclusive distribution of the Phenom Desktop Scanning Electron Microscope (SEM) in the US and Canada. The Phenom is a compact SEM designed to be extremely fast and very easy to…
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Carbon Nanotube (CNT) Synthesizer now available
Nanoscience Instruments, Inc. Announces Distribution of a New Benchtop Carbon Nanotube Synthesis Device
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Microgrippers and Force Sensors by FemtoTools announced
Nanoscience Instruments, Inc. Announces Distribution of Microgrippers and Force Sensors from FemtoTools
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Silicon-Nitride AFM probes now available
Nanoscience Instruments today announced the launch of a new line of Silicon-Nitride probes for Atomic Force Microscopes (AFMs). The new HYDRA series is available world-wide and fills a need in the market for AFM probes s…
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New line of budget-priced AFM sensors by VistaProbes announced
Nanoscience Instruments today announced the launch of VistaProbes – a new line of budget-priced sensors for Atomic Force Microscopes (AFMs). The VistaProbes line is available world-wide and fills a need in the AFM probe …
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Automated AFM introduced: The Nanosurf Nanite
Nanoscience Instruments today announces the release of the Nanosurf ® Nanite automated AFM. Swiss-based Nanosurf AG, innovators and makers of the most compact and easy-to-use Atomic Force Microscopes (AFMs) on the market…
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Small footprint passive isolator now available
Nanoscience Instruments introduces miniaturized isolation platform for AFM
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Applied Nanostructures AFM probes now available from Nanoscience Instruments
Nanoscience Instruments announces distribution of Applied Nanostructures' line of probes for Atomic Force Microscopy (AFM).
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