Near-field Scanning Optical Microscopy (NSOM)
SNOM offers the use of a very small light
source as the imaging mechanism. By using a quasipoint light
source with a diameter much smaller than the wavelength
of light, one can achieve resolutions better than the diffraction
limit. The probe, however, must be very close to the surface;
much closer than the wavelength of the light. This region
is the "Near-Field" and hence the name of the
technique.
Typically, laser light is fed to the aperture
via an optical fiber. The aperture can be a tapered fiber
coated with a metal (such as Al), a microfabricated hollow
AFM probe, or a tapered pipette. Normally, the size of the
point light source determines the resolution obtainable.
There are two types of feedback typically
used to maintain the proper working distance of the probe
to the sample. One method is quite similar to how feedback
works with an AFM - by using a cantilevered probe, the normal
force is monitored, typically by using a beam-deflection
setup as in most AFMs. The second method uses a tuning fork.
By attaching the fiber to a tuning fork, which oscillates
at its resonant frequency, can can monitor changes in the
amplitude as the tip moves over the surface. The tip is
moved laterally, and this techniques is normally referred
to as "shear-force" feedback.
Depending upon the sample being
imaged, there are multiple modes of operation for NSOM.
Transmission: Lightsource travels
through the probe aperture, and transmits through sample.
Requires a transparent sample.
Reflection: Lightsource travels
through the probe aperture, and reflects from the surface.
Lower light intensity, and tip-dependent, but allows for
opaque samples.
Collection: Sample is illuminated
from large outside light source, and the probe collects
the reflected light.
Illumination/Collection: The
probe both illuminates the sample and collects the reflected
light.
Detection of the signal can be handled
a number of different ways: Spectrometer, APD (Avalanche
Photo Diode), Photomultiplier Tube, or CCD
Data Display: several contrast mechanisms
in NSOM can be used, including polarization, topography,
birefringence, index of refraction, fluorescence, wavelength
dependence, and reflectivity.
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