06 Feb 2006

Nanoscience Instruments launches services division to provide
contract sample analysis

Phoenix, AZ - Nanoscience Instruments today announces the opening of a services division with the focus of providing contract Atomic Force Microscopy (AFM) analysis to the nanoscale research community.

Customers will benefit from fast turn-around time, complete confidentiality, and the supplied detailed project reports that include digital images, expert interpretation of findings, and description of experimental procedures.

Nanoscience Services also provides on-site sample analysis thanks to uniquely portable AFM equipment. Oversized samples, or ones requiring in-process evaluation, can now be examined at their origin.

The AFM experts at Nanoscience Services utilize state-of-the-art equipment to characterize the structure and morphology of materials at the nanometer scale. Examples of materials suitable for nanoscale evaluation include polymers, coatings, thin films, plastics, metals, powders, nanoparticles, semiconductors, composites, optics, fibers, and many more.  Cryo-microtome sample preparation is also available for analyzing the internal structure of polymers and similar materials.

For more information about contract sample analysis from Nanoscience AFM Services, see our website at www.nanoscience.com or contact us directly

Nanoscience Instruments, Inc. provides technical sales and support as a supplier of Atomic Force Microscope products. Information about AFMs, AFM accessories, and AFM probes can be found at www.nanoscience.com.

CONTACT:
Mark R. Flowers
480-940-3940 ext 223