02 Jan 2006

AFM probes by Applied Nanostructures: Now available from Nanoscience Instruments

Phoenix, AZ - Nanoscience Instruments announces distribution of Applied Nanostructures' line of probes for Atomic Force Microscopy (AFM).

Applied Nanostructures (Santa Clara, CA) manufactures AFM probes that are designed to exceed the specifications and performance of other comparably priced probes. The complete probe line features pyramidal tip geometry, very sharp tips (5-6 nm radius typical) and high aspect ratios (7-10° cone angle typical). A strict monitoring process ensures that these high-quality standards are consistently met.

Applied Nanostructures probes are compatible with nearly every Atomic Force Microscope on the market and are ideal for all common AFM imaging modes including tapping mode, contact mode, force modulation mode, magnetic force mode and electrostatic force mode. A variety of coatings is offered for all probe types and there are several specialty probes and custom designs available.

For more information on AFM probes by Applied Nanostructures, visit store.nanoscience.com or contact us directly.

Nanoscience Instruments, Inc. provides technical sales and support as a supplier of Atomic Force Microscope products. Information about AFMs, AFM accessories, and AFM probes can be found at www.nanoscience.com.

CONTACT:
Mark R. Flowers
480-940-3940 ext 223