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Nanosurf Nanite Automated AFM

The new automated Nanite AFM from Nanosurf

15 Nov 2006

Automated AFM introduced: The Nanosurf Nanite

Phoenix, AZ - Nanoscience Instruments today announces the release of the Nanosurf ® Nanite automated AFM. Swiss-based Nanosurf AG, innovators and makers of the most compact and easy-to-use Atomic Force Microscopes (AFMs) on the market, have applied their inventive designs to the challenge of automated multiple measurements - the result, a new easy to use AFM that gives you true walk away time.

The Nanite's batch programming, scripting capability and motorized X/Y/Z stage make it possible for users to prepare a series of routine measurements and leave the microscope to measure on its own. So, whether your process requires nanoscale measurements at random points on a large surface, or on multiple samples in a reproducible location, the batch-programmable Nanite AFM is up to the task.

The Nanite's patented electromagnetic scanners guarantee precise and highly linear movement for reliable quality control measurements and statistical analysis. The integrated Nanosurf Report software aids in quick, efficient evaluation and comparison of roughness, particle count and size distribution, and step heights. Typical applications range from coatings, polymers, fabrics, and fibers - to semiconductors, wafers, optical and holographic surfaces as well as data storage.

The Nanite AFM has a flexible adaptive design. Its' scan head incorporates a highly accurate, quick-release mount for easy adaptation to other surface analysis instruments. Simply remount the scan head containing the pre-aligned AFM probe and your batch program performs the same measurements time after time.

As with all Nanosurf AFMs, the Nanite features fast and simple AFM probe exchange due to pre-aligned optics that completely eliminate the need for manual laser or detector alignment, drastically reducing setup time. And you'll appreciate the Nanite's on-board video camera which observes the AFM cantilever and sample from above and from the side, making probe positioning easy.

For more information on the Nanosurf Nanite automated AFM, visit www.nanoscience.com or contact us directly.

Nanoscience Instruments, Inc. provides technical sales and support as a supplier of Atomic Force Microscope products. Information about AFMs, AFM accessories, and AFM probes can be found at www.nanoscience.com.

CONTACT:
Mark R. Flowers
480-940-3940 ext 223