1 July 2004

New conducting AFM probes by Budgetsensors

PHOENIX, AZ – Nanoscience Instruments, Inc. announces the availability of new probes manufactured by ISB - Budgetsensors.

All current lines of Budgetsensors probes are now available with a Chromium/Platinum coating. A 25 nm layer of Pt is deposited over a 5 nm layer of Cr, on both sides of the cantilever. This improves reflectivity as well as making the probe conductive.

Applications possible with these probes include:

• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin probe Force Microscopy (KFM)
• Scanning probe lithography

For more information about these probes, see our Budgetsensors data pages or our online storefront at store.nanoscience.com.

Nanoscience Instruments, Inc. provides technical sales and support as a supplier of Atomic Force Microscope products. Information about AFMs, accessories, and AFM probes can be found at www.nanoscience.com.

CONTACT:
Mark R. Flowers
480-940-3940 ext 223