10 February 2003

Nanoscience Instruments announces distribution agreement with Aurora Nanodevices for AFM tip characterization devices.

PHOENIX, AZ – Nanoscience Instruments, Inc. announces distribution of the TipCheck and NioProbe AFM tip characterization devices by Aurora Nanodevices. These devices are used to determine AFM tip morphology and shape, and can aid in determining if a probe is broken.

The tip characterization devices exploit reverse imaging where the sample images the AFM tip, and therefore provides a fast and simple way to assess new and used probes. Additionally, qualitative comparisons between tips can be made, and tip sharpness can be assessed by the very sharp peaks of less than 5 nm radius.

Nanoscience Instruments offers a suite of AFM tools that are complemented well by the AFM tip characterization devices. The Scanning Probe Image Processor software provides a means to calculate the tip shape using these devices. SPM images can then be deconvoluted based on the data. In addition, a full line of AFM probes are available to complete the offering.

Nanoscience Instruments, Inc. provides technical sales and support as a provider of nanoscience instrumentation. Products include scanning probe microscopes, AFM probes, software and accessories. Additional information can be obtained at www.nanoscience.com

CONTACT: Mark R. Flowers
480/704-5683, mflowers@nanoscience.com