1 November 2002, Nanoscience Instruments Inc News Release

New easy-to-use Atomic Force Microscope offers Dynamic Force Modes

PHOENIX, AZ – Nanoscience Instruments, Inc. announces the availability of the Nanosurf® easyScan DFM in North America. The easyScan DFM significantly increases the functionality and applications of the easyScan AFM without increasing complexity or abandoning the easyScan ease-of-use philosophy.

The new DFM offers Dynamic Force Mode, force modulation, phase contrast, and contact mode imaging. In addition, the easyScan STM can be added to the system.

The easyScan offers “push-button” ease of use. Minimal setup is required, and with a single click, the system optimizes imaging parameters and approaches to the sample. The stand-alone design allows the AFM to be placed on virtually any surface to image. In addition, options such as a translation stage and video camera are available to make setup even more convenient.

The easyScan AFM line uses unique technologies for AFM, enabling low price, low voltage, ease of use, and a compact, mobile design. These technologies include an electromagnetic scanner, which does not require dangerous high voltage, and doesn’t suffer from nonlinearities and creep as piezoelectric scanners do. In addition, pre-set cantilever chips eliminate the need for any type of laser alignment. A unique position sensitive detector implementation also allows for trouble free cantilever chip placement. Lastly, well designed optics allow for easy viewing of both the top of the cantilever for tip/sample positioning as well as a side view of the tip/sample gap for initial setup.