16 Aug 2005
Nanoscience Instruments announces CNTek™ Plus
Carbon Nanotube AFM tips
Phoenix, AZ - Nanoscience Instruments introduces CNTek
Plus AFM probes, a new sharpened carbon nanotube tip designed
for high resolution AFM imaging.
The CNTek Plus probes are the result of 6 years experience
fabricating carbon nanotube AFM probes. The improved process
gives unparalleled stability and is achieved through various
factors, including:
- Highly controlled manipulation of individual multi-walled
carbon nanotubes, which results in highly reproducible
probes composed of one multi-walled carbon nanotube.
- Strong chemical bonding between the carbon nanotube
and the surface of the microfabricated Si probe via
DC current-induced welding process.
- Sharpened multi-walled tips with small radius of
curvature: < 5 nm
These highly stable CNT AFM tips will provide superior
performance over that of conventional Si probes.
The improved sharpening process results in high lateral
resolution. This combined with the durabiltiy of carbon
nanotubes gives the probes a very long lifetime, a key
advantage over sharpened silicon probes.
Contact Nanoscience Instruments for pricing, availability
and specifications.
Nanoscience Instruments, Inc. provides technical sales
and support as a supplier of
Atomic Force Microscope products. Information about
AFMs, accessories, and AFM
probes can be found at www.nanoscience.com.
CONTACT:
Mark R. Flowers
480-940-3940 ext 223
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