26 July 2004

New Carbon Nanotube Tip AFM probes

PHOENIX, AZ – Nanoscience Instruments, Inc. announces new, high resolution carbon nanotube AFM probes.

The carbon nanotube tips are mounted to standard etched silicon AFM probes. The improvements offered by the new tips include higher resolution and high aspect ratio. The new tips expand possible atomic force microscopy applications.

Carbon Nanotube Tips offer this unique combination of advantages:

• Extremely long life
• High resolution
• High Aspect Ratio
• Gentle probe-sample interaction

For more information about these probes, see our our online storefront at store.nanoscience.com.

Nanoscience Instruments, Inc. provides technical sales and support as a supplier of Atomic Force Microscope products. Information about AFMs, accessories, and AFM probes can be found at www.nanoscience.com.

CONTACT:
Mark R. Flowers
480-940-3940 ext 223