29 April 2003

Q-Control for Atomic Force Microscopes is now available from Nanoscience Instruments

Phoenix, AZ - Nanoscience Instruments announces distribution of the Q-control by nanoAnalytics. The Q-control is an add-on to atomic force microscopes that enhances resolution and provides greater control of the forces involved in AFM imaging.

By reducing the damping of the cantilever in a dynamic force mode AFM, the Q control increases the effective quality factor of the system. The result is minimized forces exerted by the tip and improved resolution on sensitive surface structures. This has been shown to resolve features that were not possible with standard tapping mode AFM.

The principle can be applied to various AFM applications, including tapping in air, tapping in liquids, electric force microscopy, and magnetic force microscopy.

The Q-control is manufactured by NanoAnalytics in Munster, Germany.

Nanoscience Instruments, Inc. provides sales and support of atomic force microscopes, scanning tunneling microscopes, and related accessories and products. Additional information can be found at www.nanoscience.com

CONTACT: Mark R. Flowers
480/704-5683, mflowers@nanoscience.com