AFM Probes
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Available AFM Probe Types

Dynamic / Non-contact / Tapping Mode AFM Probes
A wide selection of dynamic mode AFM probes for use in air and fluid, gentle tapping and high frequency applications, and more.

Contact Mode AFM Probes
A variety of low spring constant AFM probes that are ideal for contact mode imaging.

Force Modulation Mode AFM Probes
The force constant of this type of AFM probe spans the gap between contact and non-contact mode and is specially tailored for imaging in force modulation mode.

Magnetic Force Mode (MFM) Probes
MFM sensors are designed for magnetic force microscopy. They yield a very high force sensitivity and feature magnetic coating on the tip side.

Electrostatic Force Mode (EFM) Probes
Designed for electrostatic AFM applications, EFM probes feature electrically conductive coatings and optimized force constants.

Conducting Tip AFM Probes
A variety of conducting AFM probes with coating on both sides of the sensor allowing electrical contacts between tip and sample.

Biological / Fluid / Soft Imaging AFM Probes
Designed for soft contact mode imaging in air or fluid and soft dynamic mode imaging in fluid, these probes feature low stress silicon-nitride cantilevers that are either v-shaped or rectangular. They are uniquely designed with silicon tips, allowing for a sharp radius of less than 10nm.

Force Pulling & Force Curve AFM Probes
These force pulling AFM probes are designed for force measurement applications in fluid. Their unique design features a very thin, low stress, silicon-nitride cantilever with a silicon tip.

High Aspect Ratio AFM Probes
This sensor type is for depth or step height measurements of high aspect ratio structures. They are available with various degrees of tilt compensation.

Carbon Nanotube Tip (CNT) AFM Probes
CNT probes have multi-wall nanotubes mounted to the end of their AFM tip. These Grade A CNTs offer a much greater scanning life than standard probes and combine the abilities to achieve high resolution and measure high-aspect ratio features.

Super Sharp AFM Probes
Super Sharp probes provide enhanced resolution imaging. They feature a typical tip radius of only 2nm and a higher aspect ratio near the apex. Super Sharp probes are available for dynamic mode, force modulation mode, and contact mode.

Critical Dimension AFM Probes
Critical dimension re-entrant AFM probes are ideal for measuring side wall roughness, slope angle, trench depths, and step height. Each tip is SEM inspected for quality.

Wear Resistant AFM Probes
These probes are designed for long life and superb wear resistance. Styles include uncoated, conical, nitride-tipped probes with <10nm tip radii, and high aspect ratio probes with a conductive, metal carbide coating.

Tipless AFM Cantilevers
These sensors are designed for special applications that do not require a tip at the end of the cantilever.