AFM Probe Store
Browse through hundreds of AFM probes,
review specifications & pricing, check inventory
status, and place orders.
New Probes from Nanoscience Instruments
Aspire Conical AFM Tips
The new Aspire™ AFM probes are the first conical-shaped AFM tips for the mass-market. Made of high quality, highly doped single crystal silicon, Aspire probes are robust and offer long imaging life.
Access Probes with Direct Optical View of the AFM Tip
These probes allow a direct optical view of the AFM tip and are designed for applications that require seeing the tip as it engages the surface. Available for Tapping Mode, Force Modulation Mode, and Electrostatic Force Mode.
Large Radius Tip AFM Probes
These tips offer a defined, large radius, hemispherical tip shape that can be used, for example, for step height measurements over large scan areas.
SS-ISC Super Sharp Improved Super Cone Tapping Modeand Force Modulation Mode Probes
Super Sharp AFM probes provide enhanced resolution imaging. The SS-ISC probes are available in tapping and force modulation mode.
AFM Calibration Grids
Our new grids provide 100% Coverage. These grids permit calibration of an AFM scanner in all three dimensions.
Metal Needle AFM Probes
NaugaNeedles' probes are the first commercial metallic needle AFM tips. A combination of high aspect, consistent geometry, & high conductivity enables a wide range of new applications not previously possible.
