AFM probes are coated with a conductive metal
on the tip side of the cantilever. Many are also
coated on the "back" side to improve
Coatings are typically
Platinum, with another metal to improve either
adhesion or hardness.
Conductive AFM probes are based on contact,
force modulation, and tapping mode cantilevers.
Typically, condutive AFM is done in contact with
a standard contact-mode AFM probe.
Conductive force modulation probes are typically
used for electrostatic force microscopy.
Nanoscience Instruments provides conductive
probes based on several types of cantilevers
and tips geometries. See our web store for more
Force (EFM) probes
our SSR & Conductive contact probes
our KFM & Conductive tapping probes
Carbide coated probes
our Solid Diamond Conductive
our Metallic Needle AFM probes