Conducting AFM Probes

Conducting AFM probes are coated with a conductive metal on the tip side of the cantilever. Many are also coated on the "back" side to improve reflection.

Coatings are typically Platinum, with another metal to improve either adhesion or hardness.

Conductive AFM probes are based on contact, force modulation, and tapping mode cantilevers. Typically, condutive AFM is done in contact with a standard contact-mode AFM probe.

Conductive force modulation probes are typically used for electrostatic force microscopy.

Nanoscience Instruments provides conductive probes based on several types of cantilevers and tips geometries. See our web store for more details.

View our Electrostatic Force (EFM) probes

View our SSR & Conductive contact probes

View our KFM & Conductive tapping probes

View our Metal Carbide coated probes

View our Solid Diamond Conductive

View our Metallic Needle AFM probes