Hemispherical/Metal Coated and Large Radius/Uncoated Tips
-Metal, carbide-coated, hemispherical, cone-shaped AFM probes are available for tapping mode, force modulation mode, contact mode, or nanoindentation.
-These Large Radius tips have a hemispherical tip shape that can be used for tapping mode, soft force modulation mode, force modulation mode, contact mode, and nanoindentation.
Metal Coated Probes: These probes feature a metal carbide tip. Due to the hemispherical tip shape, the ideal application is material characterization by nanoindentation (e.g. bio-medical materials, polymeres,..). HSC AFM probe tips can also be shipped with SEM images.
Large Radius Tips:
These tips feature a defined large radius, hemispherical tip shape. One example they can be used for is step height measurements over large scan areas. Untreated or chemically modified hemispherical tips are well suited for material characterization and nanoindentation.
View our Metal Carbide-Coated Hemispherical Probes
View our uncoated Large Radius Tip Probes