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High Aspect Ratio AFM Probes
 High Aspect Ratio AFM probes are designed for deep trench measurements and samples with steep sidewalls. Models are available without tilt compensation and there are also several models with angled tips for different AFM mounting designs. Various spike lengths and tip shapes are also available.
High aspect probes are designed with different tip geometries. Tilt compensated probes are designed to make the tip perpendicular to the surface. Different angles are available for different AFM systems.  View all high aspect tips on our web store.
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