High
Aspect Ratio AFM probes are designed for deep
trench measurements and samples with steep sidewalls.
Models are available without tilt compensation
and there are also several models with angled
tips for different AFM mounting designs. Various
spike lengths and tip shapes are also available.
High aspect probes are designed with different
tip geometries. Tilt compensated probes are designed
to make the tip perpendicular to the surface.
Different angles are available for different
AFM systems.
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