AFM Probe Store
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AFM Cantilevers and Chips:
Dimensions & Specifications
AFM cantilever and chip
schematics representing approximate values for most of the
standard Silicon AFM probes available from Nanoscience Instruments.
AFM chips fit most commercial Atomic Force Microscopes
(AFMs) as they are industry standard size. They
are compatible with AFMs from Nanosurf, DI/Veeco,
Agilent/Molecular Imaging, Asylum Research, JEOL,
The probe cantilevers
are defined using wet anisotropic processes. As
a result, the cantilever cross-section is trapezoidal.
The backside width of the cantilever has been chosen
to be between 35 to 45 µm . This makes the
cantilever suitable for all commercially available
AFMs. The wide backside of the cantilever also helps
reflecting laser completely for large SUM signal
and eliminates laser falling and reflecting back
from the sample surface. The cantilever thickness
and length are varied to suit the requirements of
various SPM applications. The tip is set at the
far end of the free end is consistently controlled
between 15 to 25 µm for easy and predictable
alignment of the tip and the sample.
The chip (substrate)
dimensions are 3400 µm x 1600µm x 300
µm ( Length x width x thickness). The design
fits into most commercially available SPMs.
AFM Cantilevers are specified
by their width, length, and thickness.
These parameters determine important factors like
resonance frequency and spring constant.
Standard cantilever types for
Dynamic mode / tapping mode
Available as a long (225 µm) or short (125 µm)
Length: Typically 125 - 225 µm
Width: Typically 40 µm
Thickness: 4 - 8 µm
Resonant Freq: 190 - 300 KHz
Spring Constant: 40 - 48 N/m
Force Modulation mode AFM
Length: Typically 225 µm
Width: Typically 45µm
Thickness: 2.5 µm
Resonant Freq: 60 KHz
Spring Constant: 3 N/m
Contact mode AFM
Available as a long (450 µm) or short (225 µm)
Length: Typically 225 - 450µm
Width: Typically 28-40 µm
Thickness: 1- 2 µm
Resonant Freq: 12 - 28 KHz
Spring Constant: 0.1 - 0.2 N/m
The AFM cantilevers are micromachined,
monolithic Si, exhibiting excellent uniformity. They provide
high quality imaging for all standard atomic force microscopes.
AFM cantilever coatings:
Most of our AFM probes are available
with metal coatings. Some coatings are intended only to
improve the reflectivity of the back side of the cantilevers,
and are called "reflex" coatings. Typically
Aluminum is used, but some of our probes are available
with a gold reflex coating. Many times Gold is preferred
for situations where Al may oxidize.
Other coatings are available on both
sides of the cantilever, including the tip. Examples are
Pt, Au, and magnetic materials. These are used for conductivity
measurements, EFM, MFM, biological applications, and others.
Call or email for further details.