MFM Probes
by Team Nanotec

Tip Quality control: each tip SEM inspected (without documentation)
Material: single crystal silicon
Magnetic Coating: CoCrTa
Shape: tapered cone
Tip height: > 7 microns
Radius (w/o coating): < 10 nm
Cone angle: for min. of 3µm from apex, < 12°

Modifications oft these values upon request

Cantilever Length: 225 microns (215 – 235)
Width: 35 microns (32 - 38)
Stiffness: 1.5 N/m (typ. value)
Resonant Frequency: 60 kHz (typ. value)

Modifications of these values upon request

Cantilever chip: Material: single crystal silicon
Length: 3.4 mm
Width: 1.55 mm
Thickness: 0.32 mm
Application: High resolution MFM measurements

Buy AFM probes online at the Nanoscience Shop: store.nanoscience.com