Nanoscience Instruments

Nanite AFM

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The Nanosurf® Nanite Automated AFM
Acquisition and Analysis Software




1, 2, Done

Nanite software overview
The Nanite acquisition software gives the user unparalleled comfort and accessibility to key operation controls.

Positioning the tip and sample, imaging controls, spectroscopy, and post-processing reports are all easily accessible. Additionally, the panel's controls can be expanded or reduced by selecting easy, intermediate or advanced user skill levels in the system preferences.

A typical user can learn how to use the software very quickly. Occasional users can come back to the software after months and not require any "reacquainting". Intuitive controls invite exploration rather than intimidating the user.


 

Positioning

The positioning control panel can display either the CCD camera's side view of the tip/sample gap or the overhead view to position the probe onto an area of interest. Camera and lighting options, motor control options, and automated approach controls are accessible in this panel.

Upon approach, the software automatically calibrates the detector and runs the appropriate freq. sweep (when using dynamic modes). Proper working frequency is set without further user intervention. In advanced mode, the user does have the option to change how these settings are chosen.

Scripting

Positioning the scanner and sample via the scripting interface gives you the power of automation. Scripts can be simple or they can be quite complex. You can simply assign coordinates to move the AFM head or you can program complex imaging and spectroscopy (e.g. F-d curves) parameters at each location. You can also execute several measurements at each pre-assigned location.

Imaging

Imaging controls are conveniently grouped with the data display panels, giving the user easy access to the most commonly used controls.

While imaging, you can also make measurements on the sample surface, change viewing options, and add or remove data panels to display the information you need.

Reporting

A simple mouse-click quickly takes the user from the controls of the data acquisition software into Nanosurf Report - a powerful analysis and reporting application. Image processing tools like flattening, FFT, roughness analysis are easily accessed. Presentation functions like zoom, 3D rendering, and the use of various color tables add appeal to your reports. Some key features of Nanosurf Report include:

Creation of visually appealing, professional, reports
Efficient generation of reports using templates
Extensive online help
Quantitative analysis for both surfaces and profiles
Filters, corrections, and 3D representation
Multiple export options
Reads multiple file formats from other SPMs



 


Nanite software interface

User interface settings are easily changed


Nanite positioning window with CCD side-view
Positioning control panel showing side view of tip


Nanite batch programming
Batch manager for programming automated stage positioning


Nanosurf Report
Sample report layout

 



A sample of Nanosurf Report capabilities:

Surface Analysis
Profile Analysis

Visualization
Pseudo-color representation
Photo simulation
3D continuous display
Profile curve
Waviness and roughness profiles on
the same graph

Quantitative Analysis

Hole / bump volume computation
Step height & angle measurement
Position of & distance between two points
Abbott curve & amplitude distribution curve
Calculation of primary roughness parameters
Frequency spectrum
Multi-cursor distance measurement
Abbott curve and amplitude
distribution curve
Calculation of primary roughness
parameters

Mathematical Manipulation

Polynomial form fit subtraction
Leveling
Line by line leveling
Rotation
Resampling
Leveling (both least-squares and minimum zone)
Symmetries
Polynomial form fit subtraction

Exclusion / Selection

Filtering by direct FFT editing
Cut-off filtering
Thresholding (data point selection by z-value)
Zoom (extraction of a sub-section for separate
analysis)
Profile extraction (real-time)
Cut-off filtering
Thresholding (data point selection
by z-value)
Zoom (extraction of a sub-section
for separate analysis)

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