Q-Control for Atomic Force Microscopy
by nanoAnalytics

The Q-Control by Nanoanalytics is an add-on module for atomic force microscopes. The electronic system adds an additional feedback circuit to your AFM, giving you control over the quality factor (Q) of your dynamic force mode AFM. This control enables you to improve the resolution of your system or increase the maximum scan speed by varying the AFM cantilever's Q factor.

By reducing the damping of the cantilever in a dynamic force mode AFM, the Q control increases the effective quality factor of the system. The result is minimized forces exerted by the tip and improved resolution on sensitive surface structures. This has been shown to resolve features that were not possible with standard tapping mode AFM. For examples, see the Q control applications.

The system is available with an interface for a DI/Veeco Nanoscope controller or general purpose BNC connectors.

Examples of Use:

• Minimize Forces to improve resolution while imaging in air or liquids.
• Improve overall sensitivity in magnetic or electrostatic force microscopy.
• Increase maximum scan speed by reducing the quality factor, and time constant, of the oscillating probe.