The Scanning Probe Image Processor

The de-facto standard for SPM image analysis

Overview

SPIP is the industry-leading image analysis software for Scanning Probe Microscopy (SPM) and supports virtually every SPM file format. It is also the preferred analysis software for other types of nano and micro-scale imaging - such as SEM and TEM, confocal and optical microscopy, interferometry and profilometry. SPIP's modularity allows you to choose only the modules that you need for your current research, thus minimizing your cost while providing an option for future upgrades.

Latest Version: 4.6.x   (Released: Nov. 2007. Most recent update: Feb. 2008)

New Features
	• New tool for easy X-Y scaling of images (e.g. SEM images). The tool automatically finds scaling bars in images and sets the correct physical dimensions. • The Polygon and Ellipse/Circle Measure Tools can now calculate Material, Void, and Net Volume for any selection • 11 roughness parameters validated to be consistent with NIST by The Danish National Metrology Institute, DFM • 3D-view automatically updates after altering source image • Learn More
Modules
	SPIP consists of a Basic Module and 14 optional add-on modules. You can customize the software package by purchasing only the features that you need. Learn More
Free Downloads
	Download demo copy of SPIP or a PDF version of the brochure. Learn More
Supported File Formats
	Support for over 70 predefined file formats and the ability to open almost any file with SPIP's "Heuristic File Importer." Learn More
How to purchase
	Nanoscience Instruments distributes Image Metrology's Scanning Probe Image Processor software in the United States. Please contact us directly for sales and pricing questions. Learn More