The Scanning Probe Image Processor
Software by Image Metrology

New Features & Improvements
in SPIP Version 4.6.x   (Released November 2007)

• Basic Module
  - New tool for easy X-Y scaling of images (e.g. SEM images). The tool automatically finds scaling bars in images and sets the correct physical dimensions.
  - The Polygon and Ellipse/Circle Measure Tools can now calculate Material, Void, and Net Volume for any selection
  - Improved support for large images by enabling SPIP to take advantage of extended virtual address space (4-Gigabyte Tuning)
  - New support for file formats from Veeco, Ambios, Omicron, and ADE/KLA Tencor
• Roughness & Hardness Analysis Module
  - 11 roughness parameters validated to be consistent with NIST by The Danish National Metrology Institute, DFM
  - Optional preprocessing for direct comparison with roughness measurement generated with other software packages
  
• 3D Visualization Studio Module
  - 3D-view automatically updates after altering source image
  
• Batch Processing Module
  - HTML Templates can now be edited in MS Word
• Calibration Module
  - ISO 5436 Step Height measurement now available for single profile files