Nanoscience Instruments, Inc.

480.758.5400

info@nanoscience.com

Videos
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/files/3313/7670/0749/Nanosurf_NaioAFM_--_Cantilever_Exchange.mp4/files/8313/7670/0948/Nanosurf_NaioAFM_Cantilever_Exchange.webm
TraxAFM  TraxAFM Features  TraxAFM Options & Accessories  Gallery  TraxAFM Specifications

Nanoscience Instruments TraxAFM

Top view of Nanoscience Instruments traxAFM

The Nanoscience Instruments traxAFM is the ideal atomic force microscope for education and introduction to nanoscience and nanotechnology.  The system integrates the control electronics with the scanner, which reduces the footprint and overall size of the system. Advanced features and options are included as standard components.

The traxAFM easily images features from many microns to nanometers.  Pre-aligned optics eliminate the need for any adjustments — making set up quick and easy.

The traxAFM’s price is also dramatically less than other AFMs, making it by far the most affordable AFM with similar features and durability.

Nanoscience Instruments TraxAFM

  • Standard, integrated components include:
    • Airflow shielding
    • Vibration isolation
    • XY-table (12 mm)
    • High-resolution, color, top-view camera
    • Side view sample observation
    • Control electronics 
  • Standard operating modes include:
    • Contact Mode
    • Dynamic Mode
    • Phase Imaging
    • F-D Curves
    • Magnetic Force Microscopy (MFM) 
    • Electric Force Microscopy (EFM)
  • Advanced imaging, spectroscopy, and lithography modes are available
  • Simple cantilever exchange: No laser or detector adjustment required
  • No system setup needed: Simply plug the USB cable into your PC and start the software
  • User-friendly software wizards quickly prepare measurement parameters

traxAFM features


TraxAFM tip exchange

Cantilever exchange is quick and simple thanks to the traxAFM’s
flip-over scan head design and cantilever exchange tools.

Nanoscience Instruments TraxAFM

Side view camera: provides a camera view of the tip/sample gapSide view camera for traxAFM

Advanced Modes Option
Imaging: spreading resistance, force modulation
Spectroscopy: Current-voltage, stop by end value, forward and backward pause
Lithography: draw and load CAD vector graphics, bitmap images

Isolation stage

Extended Sample Kit

SPIP post processing software

Nanoscience Instruments TraxAFM

Maximum XY-range (resolution)  70 μm (1.0 nm) 
Maximum Z-range (resolution)  14 μm (0.2 nm) 
Top view camera  3x3 mm FOV, 4x digital zoom, 2 μm optical resolution, 2048 x 1536 pixels, in-axis LED illumination 
Side view observation  5x5 mm FOV, variable LED illumination (optional camera : 2x2 mm FOV, 1280 x 1024 pixels) Approach 4 mm linear motor, continuous or step-by-step approach 
Imaging modes  Static Force (Contact Mode), Dynamic Force, Phase Contrast, MFM, EFM 
Advanced imaging modes Spreading Resistance, Force Modulation
Spectroscopy modes  Force–Distance, Amplitude–Distance, Voltage–Distance
Advanced spectroscopy modes  Current–Voltage, Stop by end value, Forward & Backward pause 
Lithography modes   Static Force (Contact Mode), Dynamic Force, Oxidation 
Advanced lithography modes  Draw and load CAD vector graphics, Bitmap images 
Remote control/add-ons  Windows scripting interface: compatible with LabView, C#, Visual Basic, MatLab, and other software. 
Operating system/PC requirements  Windows XP/Vista/7 (32/64-bit), 1280 x 1024 px screen resolution, Core2 CPU, 4 GB RAM, 1 free USB 2.0 port 
Size (LWH) / Weight / Power  204 x 204 x 160 mm / 6.5 kg / 100–240 VAC (30 W)