When imaging a new sample
in an AFM, it may be difficult to know whether you have
obtained an accurate representation of the surface. Even
when a sample has already been well-characterized, an independent
means of assessing the influence of the probe tip on the
image is desirable.
A broken or misshapen probe
tip results in inaccurate rendering of samples. Extra time
from an already busy schedule can be consumed in further
clarification work that wouldn't have been needed otherwise.
Worse, if the tip damage goes undetected, the true topographical
nature of your samples may inadvertently go unnoticed.
Using microscopy techniques
such as SEM to look for breakage in tips is neither convenient
nor economical enough to be done routinely.
A simple, convenient means
to prescreen all of your AFM tips is certainly desirable!
You can thereby save time and effort, and avoid frustration.
Fortunately, there is a simple and effective means to prescreen
your tips, and assess used tips as well.
Fast
TipCheck exploits reverse imaging to provide a fast and
simple way to assess new and used tips without the need
for SEM inspection.
Accurate
The microstructure of the TipCheck film is ideal for the
detection of tip morphology in the vicinity of the tip apex.
Convenient
The film is supplied on a chip of silicon, ready to be placed
in your AFM. Instructions are provided with examples of
images to aid you in getting started with your own sample
library.
A complete solution
By combining the TipCheck sample and SPIP
software, you have a turn-key solution to properly analyzing
your AFM data.
Tip
Characterization
devices for AFM
