Carbon Nanotube AFM Tips
CNTek™ AFM Probes

Cabon Nanotube AFM probes from Nanoscience Instruments.

Nanoscience Instruments' carbon nanotube tips (CNTs) consist of multi-wall nanotubes that are mounted onto commercial AFM probes (etched silicon tapping mode tips). The Grade A CNT AFM tips offer a much greater scanning life than standard probes and combine the abilities to archive high resolution and measure high-aspect ratio features. CNT probes enhance performance in intermittent, non-contact and force modulation modes but are not recommended for contact mode. CNTsensors can offer enhanced performance over standard non-contact tips in many applications ranging from imaging biological samples to semiconductor components.

Features:

· Extremely long life
· High resolution
· Image high-aspect ratio samples
· Gentle probe-sample interaction

Dynamic Mode Probes	Value
Nanotube Diameter Range	10 - 30 nm
Nanotube Length Range	500 - 3000 nm
Tip Angle	+/- 5 deg
Resonant Frequency	300 KHz
Spring Constant	40 N/m
Cantilever Length	125 um
Reflective Coating	30 nm Al on cantilever backside

Force Modulation Probes	Value
Nanotube Diameter Range	10 - 30 nm
Nanotube Length Range	500 - 3000 nm
Tip Angle	+/- 5 deg
Resonant Frequency	75 KHz
Spring Constant	3.0 N/m
Cantilever Length	225 um
Reflective Coating	30 nm Al on cantilever backside