We carry a variety of low spring constant AFM probes that are designed for contact mode applications. Our lineup includes both long and short cantilever probes that are compatible with most commercial Atomic Force Microscopes (AFMs), inlcuding those from Nanosurf, Veeco, Agilent, Asylum Research, and many others.

Our AppNano probes feature consistent high-quality, tight tolerances, and provide better resolution with typical tip radii of only 5-6 nm. If you're looking for a lower-priced, yet reliable probe for everyday imaging, check out our VistaProbes lineup.

General specifications for our contact mode probes are shown below. Detailed specifications, pricing, and availability for all of the AFM probes we carry can be found on our webstore: store.nanoscience.com

Typical values for our contact mode AFM probes:
Material: Highly-doped single crystal silicon
Chip Size: 3.4 x 1.6 x 0.3 mm
Tip Style: Pyramidal
Tip Height: 14 µm
Reflex Coating (optional): Aluminum or Gold

Typical values for long cantilever contact mode probes:
Force Constant: 0.2 N/m
Resonant Frequency: 12 kHz
Length: 450 µm
Mean Width: 40 µm
Thickness: 2 µm
See models: SICON (AppNano), CL (VistaProbes)

Typical values for short cantilever contact mode probes:
Force Constant: 0.1 N/m
Resonant Frequency: 28 kHz
Length: 225 µm
Mean Width: 28 µm
Thickness: 1 µm
See models: SHOCON (AppNano), CS (VistaProbes)