CLEM overlay of a whole cell
Correlative light and electron microscopy (CLEM) is the combination of fluorescence microscopy and high resolution scanning electron microscopy (SEM). Fluorescence light microscopy (LM) is used to monitor dynamic events within samples but lacks the resolution and context to yield details on an ultrastructural level. SEM provides high resolution images of organelles and synapses but cannot provide time specific or dynamic information.
The combination of the labeling power of fluorescence imaging and the high resolution structural information of electron microscopy makes correlative microscopy the perfect tool to study the complex relation between form and function in biology. Using a unique correlation method, these two modalities are combined together quickly and accurately. In seconds, datasets from LM and SEM are overlaid to high accuracy.
An integrated fluorescence with SEM system simplifies workflow and offers seamless switching between microscopic techniques. The SECOM system provides a fully automated overlay with an accuracy better than 50 nm.
The Delphi is an all-in-one system offering a CLEM solution with a small footprint.
Extremely fast correlative microscopy with the highest optical quality and overlay accuracy
The world’s first automated and integrated correlative light electron microscope
Integrated CLEM compatible with full-sized SEM and an all-in-one CLEM instrument