Being able to accommodate a much greater selection of specialty cantilevers while providing easy access to system inputs and outputs is one of the many advantages that the FlexAFM offers. This advantage is demonstrated in the following Application Note with the integration of Scanning Thermal Microscopy (SThM) imaging and local thermal analysis (nano-TA) capabilities that are offered by Anasys Instruments.

Both thermal measurement modes are available for your FlexAFM system via two discrete packages with increasing measurement capabilities :

Scanning Thermal Microscopy Option

• For imaging variations in thermal conductivity and local temperature mapping
• Requirements: FlexAFM system with Cantilever holder ST, Signal Module A, and a computer with an additional free USB port and Windows 2000 / XP (inquire about other operating systems)
• Contents: SThM Controller, Power Supply, Cal box, Cables, 5x ThermaLever GLA-1 probes, Test Sample, SThM Installation CD

Nano Thermal Analysis Option

• For imaging variations in thermal conductivity, local temperature mapping and local Nano Thermal analysis.
• Requirements: FlexAFM system with Cantilever holder ST, Signal Module A, and a computer with an additional free USB port and Windows 2000 / XP (inquire about other operating systems)
• Contents: NanoTA2 Controller, Power Supply, Cal box, Cables, 5x ThermaLever GLA-1 probes, 5x Thermalever AN2-200 probes, Calibration Sample Set, TA Studio Installation CD