 Electronics |
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| Electronics size / weight |
470 x 120 x 80 mm / 2.4 kg |
| Power Supply |
90 - 240 V~/ 30 W 50
/ 60 Hz |
| Computer interface |
USB 1.1 |
| Integrated USB hub |
2 Ports (100 mA max) |
| Measurement channels |
16 bit A/D converters, up
to seven signals depending on configuration |
| Scan generator |
16 bit D/A converter for
all axes |
| Scan speed |
Up to 60ms / line at 128
datapoints / line |
| Scan drive signals |
± 10 V, no high voltage! |
| Scan area and data points |
Individual width / height,
up to 2048 x 2048 points |
| Scan image rotation |
0° - 360° |
| Sample tilt compensation |
Hardware X/Y-slope compensation |
| Spectroscopy modes |
Single point measurements
or multiple measurements along a vector |
| Spectroscopy measurement
averaging |
1-255 |
| Spectroscopy data points |
Up to 2048 |
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| Adapters for former
easyScan Scan Heads available |
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| Software |
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Various charts of the scan
data can
be displayed simultaneously |
Line graph, Colour map, 3D
view, ... |
| Customizable display and
parameter settings using user profiles |
| On-line processing functions |
Mean fit, Polynomial fit,
Derived data, ... |
| Quick evaluation functions |
Distance, angles, cross-section,
roughness, ... |
| Data export |
BMP, ASCII, CSV, ... |
| Very easy installation |
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| PC
Requirements (computer not included with system) |
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| Physical Type |
Desktop or Laptop |
| Operating System |
Windows 2000, XP, Vista |
| Minimum Hardware Recommendations |
Pentium 4/M or AMD Athlon processor,
256MB RAM, True color 1024x768
monitor, Hardware (HW) OpenGL graphics accelerator |
| Data Port |
USB port |
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| Nanosurf
easyScan 2 Scripiting Interface |
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| Applications |
Automating measurement tasks,
lithography, custom evaluation functions, using
third party measurement equipment |
| Included control software |
Windows Scripting Host: Visual
Basic Script, Java Script, ... |
| Remote controlled by |
COM compatible languages:
LabView, MathLab, Visual Basic, Delphi, C++... |
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| Nanosurf
easyScan 2 Signal Module: S |
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| Available monitor signals |
X-axis, Y-axis, Z-Axis, Approach,
Tip Voltage, STM Current or AFM Deflection, Excitation,
Amplitude, Phase |
| Full scale corresponds to |
± 10 V, Excitation: ± 5 V |
| Power supply output |
GND, + 15 V, - 15 V |
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| Nanosurf
easyScan 2 Signal Module: A |
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| All Signal Module S signals |
| Additional signal modulation
inputs |
X-axis, Y-axis, Z-Axis, Tip
voltage, Excitation |
| Free connectors |
2 x Aux, connection made
on user request |
| Modulation range |
± 10 V, Excitation: ± 5 V |
| Additional analog user inputs |
2 x 16 bit A/D, ± 10 V |
| Additional analog user outputs |
2 x 16 bit D/A, ± 10 V |
| Synchronization output |
1 x TTL: start, point sync
pulses, variable width |
| Additional modes |
Almost unlimited |
| User inputs can optionally
be measured in all Imaging and Spectroscopy modes |
| User outputs can be modulated
in Spectroscopy measurements |
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| AFM
Measurements |
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| AFM Scan Head: |
10µm |
70µm |
110µm |
| Maximum Scan range 1) |
10 µm |
70 µm |
110 µm |
| Maximum Z-range 1) |
2 µm |
14 µm |
22 µm |
| Drive resolution Z 2) |
0.027 nm |
0.21 nm |
0.34 nm |
| Drive resolution XY 2) |
0.15 nm |
1.1 nm |
1.7 nm |
| XY-Linearity Mean Error |
< 0.6 % |
< 1.2% |
< 0.6% |
Z measurement noise level
(RMS, Static Mode) |
0.07 nm
(max. 0.2 nm) |
0.6 nm
(max. 0.8 nm) |
0.4 nm
(max. 0.55 nm) |
Z measurement noise level
(RMS, Dynamic Mode) |
0.04 nm
(max. 0.07 nm) |
0.5 nm
(max. 0.8 nm) |
0.3 nm
(max. 0.55 nm) |
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| Design |
Tripod Stand-alone |
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Scan head weight |
350 g |
| Sample observation optics |
Dual lens system (top/side
view) |
Sample size |
Unlimited |
| Optical magnification |
Top 12 x / Side 10 x |
Automatic approach |
5 mm |
| View field |
Top 4 x 4 mm / Side 5 x 3 mm |
Max. approach speed |
0.1 mm/s |
| Sample illumination |
White LEDs |
Cantilever alignment |
Automatic adjustment |
| Electrical connection to tip |
Available |
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| 1) Manufacturing
tolerances are ± 15 % for 10 µm and 70 µm, ± 10 % for
110 µm scan heads |
| 2) Calculated
by dividing the maximum range by 16 bits |
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| AFM
Basic Module |
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| Imaging modes |
Static Force (Contact), Const.Force
(Topography), Const.Height (Deflection) |
| Spectroscopy modes |
Force - Distance, Force -
Tip voltage |
| Tip voltage |
± 10 V in 5mV steps |
| The AFM Basic Module is required
for using AFM Scan Heads |
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| AFM
Dynamic Module |
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| Additional imaging modes |
Dynamic Force (Intermittent
Contact, etc.),
Const. Amplitude (Topography),
Const. Height (Amplitude) |
| Additional spectroscopy modes |
Amplitude - Distance |
| Dynamic frequency range |
15 - 300 kHz |
| Dynamic frequency resolution |
< 0.1 Hz |
| The AFM Basic Module is required
for using the Dynamic AFM Module |
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| AFM
Mode Extension Module |
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| Additional imaging modes |
Phase Contrast, Force Modulation,
Spreading Resistance |
| Additional spectroscopy modes |
Phase - Distance, Current
- Voltage, Current - Distance, etc. |
| Phase contrast range |
± 90° |
| Phase contrast resolution |
< 0.05° |
| Phase reference range |
0 - 360° |
| Tip current measurement |
± 100 µA, 3 nA resolution |
Both the AFM Basic Module
and the AFM Dynamic Module are required when using
the AFM Mode Extension
Module. |
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| AFM Probes |
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| Manufacturer Compatibility |
Applied Nanostructures, Vistaprobes™, Nanosensors and Nanoworld® |
| Mode Compatibility |
Static Force / Contact Mode,
Dynamic Force / Tapping / Alternating Contact Mode,
Spreading Resistance / Electrostatic Force Mode,
Force Modulation Mode,
Magnetic Force Mode |
| Available Tip Types |
Standard pyramidal, Rotated pyramidal, Super Sharp, High Aspect Ratio, Tipless
Conducting, Magnetic, Diamond coated, and more |
| Typical Load |
10 nN |
| Typical DFM frequency |
190 kHz |
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| Video
Module |
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| Camera system |
Dual video (top/side view) |
| Magnification |
Top 100 x / Side 70
x |
| View Fields |
Top 3.2 x 2.7 mm / Side 4.1
x 3.4 mm |
| Image pixels |
352 x 288 |
| Video display |
In control software, can
be saved as JPEG |
| Analog video output |
PAL Video-S |
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| Micrometer
Translation Stage |
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| XY resolution |
< 0.5 µm |
| Travel |
13 mm |
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| Specifications
are subject to change without notice |
