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The Nanosurf® EasyScan 2 AFM

Basic AFM package gets you started with Atomic Force Microscopy

Basic Atomic Force Microscope - EasyScan 2

The easyScan 2 Basic AFM Package masters topography imaging and force spectroscopy in Static Force mode (aka contact mode) – the fundamental functions for surface measurement. An ideal package for use in all entry level situations, due to its easy handling and positioning plus its flexibility, it can measure almost any sample size and geometry.

Typical applications include:

  • Surface roughness
  • Hardness measurement
  • Corrosion
  • Surface tension
  • Surface inspection

Key Benefits:

  • Portable, compact atomic force microscope: Fits in every lab
  • Stand-alone design: Able to measure on small and large samples alike
  • Ease of use, dual lens and automatic approach: Ideal for nanotechnology education and outreach
  • Cantilever Alignment Chip technology: Easy tip change without any adjustments
  • Very affordable

Options

The easyScan 2 AFM offers a number of optional accessories:
  • Dual View CCD Camera
  • STM head
  • X-Y translation table
  • Signal Access box
  • Vibration Isolation Table
  • Post-processing software
  • Nanosurf Scripting software
  • Choice of 3 different scanners (high resolution, mid-range, and large scan)
  • Upgrade path to Dynamic force modes

See additional easyScan 2 specifications here.

 
 
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