More often than not, the sample dictates the measurement mode. Soft, sensitive or sticky samples suffer under static force, even if the forces amount to less than 20 nN.

Dynamic Force mode offers the ideal solution. Instead of tracing the topography line by line with a constant force, the cantilever is vibrated near its resonance frequency and scanned across the surface with constant vibration amplitude, thus experiencing only intermittent contact with the surface. In this manner, dynamic force microscopy eliminates potentially damaging lateral forces, making it the method of choice for many AFM measurements.