The force constant of this type of AFM probe spans the gap between contact and non-contact mode and is specially tailored for imaging in force modulation mode. Our selection of force modulation probes are compatible with most commercial Atomic Force Microscopes (AFMs), inlcuding those from Nanosurf, Veeco, Agilent, Asylum Research, and many others.

Our AppNano probes feature consistent high-quality, tight tolerances, and provide better resolution with typical tip radii of only 5-6 nm. If you're looking for a lower-priced, yet reliable probe for everyday imaging, check out our VistaProbes lineup.

General specifications for our force modulation mode probes are shown below. Detailed specifications, pricing, and availability for all of the AFM probes we carry can be found on our webstore: store.nanoscience.com

Typical values for our force modulation mode AFM probes:
Material: Highly-doped single crystal silicon
Chip Size: 3.4 x 1.6 x 0.3 mm
Tip Style: Pyramidal
Tip Height: 14 µm
Reflex Coating (optional): Aluminum or Gold
Force Constant: 3 N/m
Resonant Frequency: 60 kHz
Length: 225 µm
Mean Width: 45 µm
Thickness: 2.5 µm
See models: FORT (AppNano), FM (VistaProbes)