Surface Analysis Techniques

AFM Services

Dynamic-force mode AFM
The sample surface is analyzed with dynamic-force mode AFM, also known as tapping or non-contact mode. Surface topography and phase lag signals are collected for each image and can be obtained at multiple magnifications (scan sizes) and/or at multiple locations on the sample surface. Standard silicon cantilevers with resonance frequencies ranging from 150 - 300 kHz are used.

Contact mode AFM
The sample surface is analyzed with contact mode AFM. Two data signals may be collected for each image, typically the surface topography and the deflection (error) signals. Images can be obtained at multiple magnifications (scan sizes) and/or at multiple locations on the sample surface. We use standard silicon nitride or contact-mode silicon cantilevers.

Additional modes
Specialty modes such as electric-force and force-modulation are available upon request and consultation.

Non-contact Optical Profilometry

Digital Holographic Microscope
New DHM technology allows us to analyse surfaces with nm height precision. The technique allows for large image sizes up to 12mm x 12mm. Software stitching gives even larger possible image sizes.

More information about the new Trimos TR SCAN DHM.

Advanced Image Analysis

Includes complex image analysis procedures, such as image thresholding, particle counting, and surface roughness calculations.