We carry a variety of high spring constant AFM probes that are designed for dynamic force mode applications. Dynamic force mode is also commonly reffered to as tapping mode, intermittent contact mode, non-contact mode, wave mode, and acoustic AC mode. Our selection of dynamic force mode probes includes both long and short cantilever models that are compatible with most commercial Atomic Force Microscopes (AFMs), inlcuding those from Nanosurf*, Veeco, Agilent, Asylum Research, and many others.
*Nanosurf AFMs use the long model probe for dynamic mode.

Our AppNano probes feature consistent high-quality, tight tolerances, and provide better resolution with typical tip radii of only 5-6 nm. If you're looking for a lower-priced, yet reliable probe for everyday imaging, check out our VistaProbes lineup.

General specifications for our non-contact mode probes are shown below. Detailed specifications, pricing, and availability for all of the AFM probes we carry can be found on our webstore: store.nanoscience.com

Typical values for our non-contact mode AFM probes:
Material: Highly-doped single crystal silicon
Chip Size: 3.4 x 1.6 x 0.3 mm
Tip Style: Pyramidal
Tip Height: 14 µm
Reflex Coating (optional): Aluminum or Gold

Typical values for long cantilever non-contact mode probes:
Force Constant: 48 N/m
Resonant Frequency: 190 kHz
Length: 225 µm
Mean Width: 40 µm
Thickness: 7 µm
See models: ACL (AppNano), T190 (VistaProbes)

Typical values for short cantilever non-contact mode probes:
Force Constant: 40 N/m
Resonant Frequency: 300 kHz
Length: 125 µm
Mean Width: 40 µm
Thickness: 4 µm
See models: ACT (AppNano), T300 (VistaProbes)