Critical Dimension AFM Probes

Nanoscience Products: AFM Probes > Critical Dimension AFM Probes

Ideal for measuring side wall roughness, slope angle, trench depths, and step height. All cantilevers are 125 µm long with a force constant of 40 N/m and a resonance frequency of 300 kHz. Coating: Al .

Browse these categories under "Critical Dimension AFM Probes"

Team Nanotec CDP55A Depth Measurement AFM Probes

Critical dimension depth measurement AFM probe. Tip Width: 40 - 55 nm, Effective Length: 500-700 nm, Overhang: none

Team Nanotec CDR50S Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 40 - 50 nm, Overhang: > 5 nm, Effective Length: 190-250 nm

Team Nanotec CDR70S Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 57 - 70 nm, Overhang: > 5 nm, Effective Length: > 350 nm

Team Nanotec CDR120 Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 90 - 120 nm, Overhang: > 5 nm, Effective Length: > 500 nm

Team Nanotec CDR130S Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 115 - 140 nm, Overhang: > 15 nm, Effective Length: > 200 - 300 nm

Team Nanotec CDR300 Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 200 - 300 nm, Overhang: > 15 nm, Effective Length: > 1 µm

Team Nanotec CDRX850 Critical Dimension AFM Probes

Critical dimension re-entrant AFM probes. Tip Width: 600 - 850nm, Overhang: > 100nm, Effective Length: > 5 µm