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KFM & Conductive Tapping Mode AFM Probes

Nanoscience Products: AFM Probes > KFM & Conductive Tapping Mode AFM Probes

KFM & Conducting Tapping Mode AFM Probes

KFM / KPFM (Kelvin Probe Force Microscopy) and conductive tapping mode probes are offered with Pt and Pt/Ir coatings for conductive AFM measurements.

Browse these categories under "KFM & Conductive Tapping Mode AFM Probes"

Team Nanotec Conductive Tapping Mode Probes

Team Nanotec Conductive Tapping Mode Probes

Team Nanotec high resolution conductive tapping mode AFM probes.
Pt coating; Length: 125 µm; Spring Constant: 40 N/m; Res. freq: 300 kHz

Featured products under "KFM & Conductive Tapping Mode AFM Probes"

Show product details for AppNano Conductive Tapping Mode AFM Probes

AppNano Conductive Tapping Mode AFM Probes

Electrostatic force mode AFM probes with Pt/Ir coating, 40 N/m spring constant, and 300 KHz resonance.

Powerful image processing software for your AFM or STM system:
SPIP - the Scanning Probe Image Processor

40% off full configurations!

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