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Metal Carbide-Coated AFM Probes

Metal Carbide Coated Tapping Mode AFM Probes
Metal Carbide-coated AFM probes are both conductive and wear resistant for extended life operation in tapping mode, force modulation mode, contact mode, and nanoindentation.

Browse these categories under "Metal Carbide-Coated AFM Probes"

Team Nanotec High Aspect Carbide-coated - 300kHz

Team Nanotec High Aspect Carbide-coated - 300kHz

Team Nanotec Extended Life High Aspect Ratio AFM probes with conductive metal carbide coating. Aspect Ratio: 5:1, Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz

Team Nanotec High Aspect Carbide-coated - 75kHz

Team Nanotec High Aspect Carbide-coated - 75kHz

Team Nanotec Extended Life High Aspect Ratio AFM probes with conductive metal carbide coating. Aspect Ratio: 5:1, Length: 225 µm, Spring Constant: 3 N/m, Resonant freq: 75 kHz


Featured products under "Metal Carbide-Coated AFM Probes"

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Tapping Mode Probes

Team Nanotec HSC Hemispherical Cone-shaped Tapping Mode Probes

Team Nanotec Tapping mode AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 125 µm, Spring Constant: 40 N/m , Resonant freq: 300 kHz

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Force Modulation Probes

Team Nanotec HSC Hemispherical Cone-shaped Force Modulation Probes

Team Nanotec Force Modulation AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 225 µm, Spring Constant: 3.0 N/m , Resonant freq: 75 kHz

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Contact Mode Probes

Team Nanotec HSC Hemispherical Cone-shaped Contact Mode Probes

Team Nanotec Contact mode AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 450 µm, Spring Constant: ~ 0.2 N/m

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec Nanoindentation AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 125 µm, Spring Constant: ~ 200 or ~ 650 N/m

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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