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Nanoscience Specials

Frequenty Asked Questions

AFM Probe Advisor

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Veiw all AFM Probes

Standard AFM Probes

Dynamic & Tapping
Contact mode
Force Modulation mode
Fluid & Bio imaging

Wear Resistant Probes

All-Diamond AFM tips
Diamond-coated AFM tips
Metal Carbide coated
Nanotube AFM tips

Conductive AFM Probes

Electrostatic Force (EFM)
SSR & Conductive contact
KFM & Conductive tapping
Doped Diamond-coated
Metal Carbide-coated

Magnetic AFM Probes

Standard MFM
High Aspect MFM

High Aspect AFM Probes

Standard Silicon High Aspect
Conical Silicon High Aspect
Critical Dimension AFM tips
Nanotube AFM tips

High Resolution Probes

Pyramidal Silicon Super Sharp
Conical Silicon Super Sharp
Carbon Super Sharp

Hemispherical &
Large Radius Tips

Metal Coated
250 to 750 nm Tip Radius
Nanoindentation

Lithography AFM Probes

All Diamond AFM Tips
Diamond-coated AFM Tips

Sensing AFM Probes

Force Curve / Pulling
Tipless cantilevers

Biological & Fluid Probes

Fluid Tapping mode
Fluid Contact mode
Tipless Cantilevers for Liquid
Silicon Nitride cantilevers

Manipulation
& Sensing

Controllers

Thiol Chemicals

Characterization
& Standards

TipCheck Devices

AFM X-Y

STM X-Y

Force Calibration

Colloids

Misc. AFM Supplies

Vibration Isolators

STM Samples

STM Wire & Cutters

Misc.

All AFM Probes & SPM Supplies

Characterization & Standards

Nanoscience Products: Characterization & Standards

Browse these categories under "Characterization & Standards"

Colloids

AFM X-Y Lateral Standards

AFM X-Y Lateral Standards

STM X-Y Lateral Standards

STM X-Y Lateral Standards

TipCheck Devices

TipCheck Devices

Force Calibration Cantilever Arrays

Force Calibration Cantilever Arrays

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