Searching... Please Wait.

Nanoscience Specials

Frequenty Asked Questions

AFM Probe Advisor

See What's NEW . . .

Veiw all AFM Probes

Standard AFM Probes

Dynamic & Tapping
Contact mode
Force Modulation mode
Fluid & Bio imaging

Wear Resistant Probes

All-Diamond AFM tips
Diamond-coated AFM tips
Metal Carbide coated
Nanotube AFM tips

Conductive AFM Probes

Electrostatic Force (EFM)
SSR & Conductive contact
KFM & Conductive tapping
Doped Diamond-coated
Metal Carbide-coated

Magnetic AFM Probes

Standard MFM
High Aspect MFM

High Aspect AFM Probes

Standard Silicon High Aspect
Conical Silicon High Aspect
Critical Dimension AFM tips
Nanotube AFM tips

High Resolution Probes

Pyramidal Silicon Super Sharp
Conical Silicon Super Sharp
Carbon Super Sharp

Hemispherical &
Large Radius Tips

Metal Coated
250 to 750 nm Tip Radius
Nanoindentation

Lithography AFM Probes

All Diamond AFM Tips
Diamond-coated AFM Tips

Sensing AFM Probes

Force Curve / Pulling
Tipless cantilevers

Biological & Fluid Probes

Fluid Tapping mode
Fluid Contact mode
Tipless Cantilevers for Liquid
Silicon Nitride cantilevers

Manipulation
& Sensing

Controllers

Thiol Chemicals

Characterization
& Standards

TipCheck Devices

AFM X-Y

STM X-Y

Force Calibration

Colloids

Misc. AFM Supplies

Vibration Isolators

STM Samples

STM Wire & Cutters

Misc.

All AFM Probes & SPM Supplies

High Aspect Ratio - Pyramidal Silicon Tips

Nanoscience Products: AFM Probes > High Aspect Ratio - Pyramidal Silicon Tips

Standard Silicon High Aspect Ratio AFM Tips

High Aspect Ratio AFM probes with pyramidal silicon tips are designed for deep trench measurements and samples with steep sidewalls. Models are available without tilt compensation and there are also several models with angled tips for different AFM mounting designs. Various spike lengths are also available.

Show product details for High Aspect Ratio - Pyramidal Silicon Tips

High Aspect Ratio - Pyramidal Silicon Tips

Applied Nanostructures High Aspect Ratio Tapping mode probes - 0°,3°, or 12° tilt. Cantilever Length: 125, Spring Constant: 40 N/m, Resonant freq: 300 kHz

Powerful image processing software for your AFM or STM system:
SPIP - the Scanning Probe Image Processor

40% off full configurations!

US & Canada
888-777-5573
(toll free)

International
+1 480-940-3940

The best prices and the largest selection of AFM probes

We accept:
All Contents © 2002 - 2013 Nanoscience Instruments, Inc.