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MFM Probes - High Aspect Ratio

Nanoscience Products: AFM Probes > MFM Probes - High Aspect Ratio

Magnetic Force Mode AFM Probes with High Aspect Ratio Tips

Designed for magnetic force microscopy, these conical-tipped high aspect ratio AFM probes yield a very high force sensitivity and feature a magnetic coating (available in various thicknesses) covering the cantilever and tip.

Browse these categories under "MFM Probes - High Aspect Ratio"

Team Nanotec HR-MFM45 Magnetic Force Mode Probes

Team Nanotec HR-MFM45 Magnetic Force Mode Probes

Team Nanotec High Resolution MFM probes.
Co coating, Spring Constant: 0.7 N/m, Res. freq: 45 kHz

Team Nanotec HR-MFM75 Magnetic Force Mode Probes

Team Nanotec HR-MFM75 Magnetic Force Mode Probes

Team Nanotec High Resolution MFM probes.
Co coating, Spring Constant: 3.0 N/m, Res. freq: 75 kHz

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