These tips offer a defined large radius, hemispherical tip shape that can be used, for
example, for step height measurements over large scan areas. Untreated or
chemically modified hemispherical tips are well suited for material characterization
Team Nanotec Soft Force Modulation/Contact mode AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 225 Ám, Spring Constant: 0.7 N/m, Resonant freq: 45 kHz. SEM image and data provided.