Large Radius Tip

Nanoscience Products: AFM Probes > Large Radius Tip

These tips offer a defined large radius, hemispherical tip shape that can be used, for example, for step height measurements over large scan areas. Untreated or chemically modified hemispherical tips are well suited for material characterization and nanoindentation.

Team Nanotec LRCH Large Radius Hemispherical Nanoindentation Probes

Team Nanotec Nanoindentation AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 125 µm, Spring Constant: ~ 250 OR ~ 750 N/m. SEM image and data provided.

Team Nanotec LRCH Large Radius Hemispherical Tapping Mode Probes

Team Nanotec Tapping mode AFM probes with an uncoated, 250, 500, OR 750 nm radius, hemispherical tip. Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz. SEM image and data provided.

Team Nanotec LRCH Large Radius Hemispherical Force Modulation Probes

Team Nanotec Force Modulation AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 225 µm, Spring Constant: 3.0 N/m, Resonant freq: 75 kHz. SEM image and data provided.

Team Nanotec LRCH Large Radius Hemispherical Soft Force Modulation/Contact Mode Probes

Team Nanotec Soft Force Modulation/Contact mode AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 225 µm, Spring Constant: 0.7 N/m, Resonant freq: 45 kHz. SEM image and data provided.

Team Nanotec LRCH Large Radius Hemispherical Contact Mode Probes

Team Nanotec Contact mode AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 450 µm, Spring Constant:
~ 0.2 N/m , Resonant freq: 15 kHz. SEM image and data provided.