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250 to 750 nm Tip Radius
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Metal Carbide-Coated Hemispherical Probes

Nanoscience Products: AFM Probes > Metal Carbide-Coated Hemispherical Probes

Metal Carbide-Coated Tapping Mode AFM Probes

Metal, carbide-coated, hemispherical, cone-shaped AFM probes for tapping, force modulation, contact, or nanoindentation applications.

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Tapping Mode Probes

Team Nanotec HSC Hemispherical Cone-shaped Tapping Mode Probes

Team Nanotec Tapping mode AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 125 µm, Spring Constant: 40 N/m , Resonant freq: 300 kHz

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Force Modulation Probes

Team Nanotec HSC Hemispherical Cone-shaped Force Modulation Probes

Team Nanotec Force Modulation AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 225 µm, Spring Constant: 3.0 N/m , Resonant freq: 75 kHz

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Contact Mode Probes

Team Nanotec HSC Hemispherical Cone-shaped Contact Mode Probes

Team Nanotec Contact mode AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 450 µm, Spring Constant: ~ 0.2 N/m

Show product details for Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec Nanoindentation AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 125 µm, Spring Constant: ~ 200 or ~ 650 N/m

Powerful image processing software for your AFM or STM system:
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