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AFM X-Y Lateral Standards

Nanoscience Products: Characterization & Standards > AFM X-Y Lateral Standards
Show product details for AFM Calibration Grids

AFM Calibration Grids

Silicon XYZ grating with 4 µm OR 10 µm period and 25 nm step height.

Show product details for AFM Calibration Grids
Show product details for Waffle Grid for AFM Calibration

Waffle Grid for AFM Calibration

Price $55.00

Waffle Grid for Atomic Force Microscope calibration. Pattern spacing: 463 nm. Pattern height: ~31 nm.

Show product details for Waffle Grid for AFM Calibration Add to the cart: Waffle Grid for AFM Calibration

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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