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Nanoindentation

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Nanoindentation AFM probes
Show product details for Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec HSC Hemispherical Cone-shaped Nanoindentation Probes

Team Nanotec Nanoindentation AFM probes with tungsten carbide-coated, hemispherical, cone-shaped tips. Length: 125 µm, Spring Constant: ~ 200 or ~ 650 N/m

Show product details for Team Nanotec LRCH Large Radius Hemispherical Nanoindentation Probes

Team Nanotec LRCH Large Radius Hemispherical Nanoindentation Probes

Team Nanotec Nanoindentation AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 125 µm, Spring Constant: ~ 250 OR ~ 750 N/m. SEM image and data provided.

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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