Team Nanotec Nanoindentation AFM probes with an uncoated, 250, 500, or 750 nm radius, hemispherical tip. Length: 125 µm, Spring Constant: ~ 250 OR ~ 750 N/m. SEM image and data provided.
Powerful image
processing software for your AFM or STM system:
SPIP - the Scanning Probe Image Processor