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Conical Silicon Super Sharp AFM Probes

Show product details for SS-ISC Super Sharp Improved Super Cone Tapping Mode Probes

SS-ISC Super Sharp Improved Super Cone Tapping Mode Probes

Team Nanotec Tapping Mode Super Sharp Improved Super Cone AFM probes. Length: 125 µm, Spring Constant: 40 N/m, Resonance freq: 300 kHz, Tip radius: < 5 nm

Show product details for SS-ISC Super Sharp Improved Super Cone Force Modulation Probes

SS-ISC Super Sharp Improved Super Cone Force Modulation Probes

Team Nanotec Force Modulation Super Sharp Improved Super Cone AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m, Resonance freq: 75 kHz, Tip radius: < 5 nm

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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