Pyramidal Silicon Super Sharp Probes

ACT-SS Super Sharp Dynamic Mode AFM Probes

Applied Nanostructures AC/Tapping mode Super Sharp AFM probes. Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz, Tip radius: 2 nm

ACL-SS Super Sharp Dynamic Mode AFM Probes

Applied Nanostructures AC/tapping mode Long cantilever Super Sharp AFM probes. Length: 225 µm, Spring Constant: 45 N/m, Resonant freq: 190 kHz, Tip radius: 2 nm

ACST-SS Super Sharp Soft Tapping Mode AFM Probes

Applied Nanostructures AC / Soft Tapping mode Super Sharp AFM probes. Length: 150 µm, Spring Constant: 7 N/m, Resonant freq: 150 kHz, Tip Radius: 2 nm

FORT-SS Super Sharp Force Modulation AFM probes

Applied Nanostructures FORce Modulation / Tapping mode Super Sharp AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m, Resonant freq: 62 kHz, Tip Radius: 2 nm

SICON-SS Super Sharp Contact Mode AFM probes

Applied Nanostructures Silicon CONtact mode Super Sharp AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m, Resonant freq: 12 kHz , Tip Radius: 2 nm

SHOCON-SS Super Sharp Contact Mode AFM probes

Applied Nanostructures SHOrt CONtact mode Super Sharp AFM probes. Length: 225 µm, Spring Constant: 0.10 N/m, Resonant freq: 28 kHz, Tip Radius: 2 nm