Force Sensor Probes

Nanoscience Products: Nano Manipulation and Sensing > Force Sensor Probes

Model Number	Force Range	Sensitivity	Resolution @ 10 Hz	Data Sheet
FT-S100	± 100 µN	50 µN/V	0.005 µN
FT-S1000	± 1,000 µN	500 µN/V	0.05 µN
FT-S10000	± 10,000 µN	5,000 µN/V	0.5 µN

Overview

The FemtoTools force sensing probes offer the highest level of precision and sensitivity in the micro- and nanodomains. These unique tools enable the recording of forces, both compression and tension, from millinewtons (10^-3 N) down to sevaral nanonewtons (10^-9 N)*.

*Unlike AFM cantilevers, which can be used to record force in the direction perpendicular to the cantilever axis, the unique FT-S force sensing probes record forces in the direction parallel to the probe axis.

Features

Unique force sensing range (5 nN to 10 mN)
Fast: Can measure force at a bandwidth of up to 8 kHz
Optimized technology for microforce sensing (parallel sensor motion/no tip slippage)
Individually calibrated (more accurate than any other technique)
Insensitive to changes in the environment (temperature, humidity)
Low output signal drift (highly stable)
Low cross-sensitivity to off-axis forces (highly selective)
300% full-scale overload protection
Air, liquid and vacuum (SEM) compatible
No performance degradation & no change in calibrated sensitivity over more than 100,000 load cycles
The force sensing probe can be set to an electric potential
Convenient 0-5V analog output proportional to the applied force
Custom probe tips available (i.e. high aspect, sharpened, hardened)
Easily interfaced with your PC through USB and the Force Aquisition System (FT-SC01)
Seamless integration with FemtoTool's single- or multi-axis stages and complete sensing and assembly systems

Application Areas

Microassembly, microfactories, microrobotics
Contact force measurements, MEMS characterization
Nanomanipulation
Biological and biomedical research
Sample probing
Material characterization
Force controlled fiber pulling

Application Examples: Click Here for Videos & Overviews

Working Principle

The FT-S micro force sensors are designed to measure force changes with a resolution of better than one micro-Newton. This corresponds to the weight of only 0.1 mg. Unlike conventional force sensors based on strain gauges, the FemtoTools FT-S sensors use the principle of capacitive deflection measurement. Capacitive micro force sensing outranges strain gauge-based sensors and piezoelectric sensors in terms of stability, sensitivity and resolution. The sensing element of the FT-S sensor is fabricated using MEMS (micro-electromechanical systems) technology. Single crystalline silicon featuring superior mechanical and electrical properties is used as a base material.

Requirements / Recommendations

Our Force Aquisition System (FT-SC01) is recommended for interfacing the sensors to your PC. However, some engineers choose to utilize their own suitable data acquisition system (stable 5V power supply and a high resolution 0-5V analog input).

A micromanipulator will be required to either position the sensor, or position your sample. A manipulator with a resolution (or minimum step size) of 0.25 microns is sufficient for most applications. If you're in need of a single- or multi-axis manipulator, an entire custom setup, or anything in between, we can help. Please contact us.

Force Sensing Probe 100 µN

Force Sensing Probes. Individually Calibrated. Range: ± 100 µN,
Sensitivity: 50 µN/V, Resolution @10Hz: 0.005 µN.

Force Sensing Probe 1,000 µN

Force Sensing Probes. Individually Calibrated. Range: ± 1,000 µN,
Sensitivity: 500 µN/V, Resolution @10Hz: 0.05 µN.

Force Sensing Probe 10,000 µN

Force Sensing Probes. Individually Calibrated. Range: ± 10,000 µN,
Sensitivity: 5,000 µN/V, Resolution @10Hz: 0.5 µN.