High Aspect Ratio - Conical Silicon Tips

Nanoscience Products: AFM Probes > High Aspect Ratio - Conical Silicon Tips

Conical Silicon High Aspect Ratio AFM Tips

High Aspect Ratio AFM probes with conical silicon tips are designed for deep trench measurements and samples with steep sidewalls. Models are available without tilt compensation and there are also several models with angled tips for different AFM mounting designs.

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Team Nanotec Improved Super Cone: ISC75

Team Nanotec Improved Super Cone AFM probes

Aspect Ratio: 5:1, Length: 225 µm, Spring Constant: 3 N/m, Resonant freq: 75 kHz

Team Nanotec Improved Super Cone: ISC300

Team Nanotec Improved Super Cone AFM probes

Aspect Ratio: 5:1, Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz

Team Nanotec High Aspect Ratio: HAR5-75

Team Nanotec High Aspect Ratio AFM probes - Aspect Ratio: >5:1,

Length: 225 µm, Spring Constant: 3.0 N/m, Resonant freq: 75 kHz

Team Nanotec High Aspect Ratio: HAR5-300

Team Nanotec High Aspect Ratio AFM probes - Aspect Ratio: >5:1,

Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz

Team Nanotec High Aspect Ratio: TC-HAR5-15

Team Nanotec Tilt Compensated High Aspect Ratio AFM probes

Aspect Ratio: >5:1, Tilt Compensation: 10°, Length: 450 µm, Spring Constant: 0.2 N/m, Resonant freq: 15 kHz

Team Nanotec High Aspect Ratio: TC-HAR5-300

Team Nanotec Tilt Compensated High Aspect Ratio AFM probes

Aspect Ratio: >5:1, Tilt Compensation: 12°, Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz