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Contact Mode AFM Probes

Contact Mode
Low spring constant AFM probes that are used by a wide variety of AFMs for contact mode imaging.
Show product details for AppNano SHOCON Contact or (Fluid Tapping) AFM Probes

AppNano SHOCON Contact or (Fluid Tapping) AFM Probes

Applied Nanostructures SHOrt CONtact mode silicon AFM probes. Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz

Show product details for Aspire CCS Conical Contact Mode Short Cantilever

Aspire CCS Conical Contact Mode Short Cantilever

Aspire CCS Conical Contact mode Short Cantilever AFM probes.
Length: 225 µm, Spring Constant: 0.1 N/m, Resonant freq: 28 kHz

Show product details for Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

Vistaprobes Contact mode Short cantilever silicon AFM probes.
Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz

Show product details for AppNano SICON Contact Mode AFM Probes

AppNano SICON Contact Mode AFM Probes

Applied Nanostructures Silicon CONtact mode AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz

Show product details for Vistaprobes CL Contact Mode AFM Probes

Vistaprobes CL Contact Mode AFM Probes

Vistaprobes Contact mode Long cantilever silicon AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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