Team Nanotec CDR120 Critical Dimension AFM Probes

Nanoscience Products: AFM Probes > Critical Dimension AFM Probes > Team Nanotec CDR120 Critical Dimension AFM Probes

Critical Dimension Re-entrant AFM Probes - 120 nm width

Team Nanotec offers CDR120 probes for measuring side wall roughness, slope angle, trench depths, and step height. Each tip is SEM inspected for quality (micrographs available upon request), and each chip is uniquely numbered.

The backside of the cantilever is treated with an Al reflex coating to enhance the reflectivity of the laser beam and prevent light from interfering with the cantilever.

The sensor offers unique features:

re-entrant overhanging tip
monolithic material
highly doped to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

Technical Data	Typical Value
Force Constant	40 N/m
Resonance Frequency	300 kHz
Cantilever Length	125 µm
Cantilever Width	35 µm
Overhang	> 5 nm
Effective Tip Length	> 500 nm
Tip Width	90 - 120 nm

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Qty	Part #	Description	Price
	CDR120-5	Team Nanotec CDR120 Re-entrant probes - 5 pack Critical Dimension Re-entrant Tip with 120 nm width, 5 nm overhang and 300 kHz resonance.	$2,490.00
	CDR120-15	Team Nanotec CDR120 Re-entrant probes - 15 pack Critical Dimension Re-entrant Tip with 120 nm width, 5 nm overhang and 300 kHz resonance.	$6,440.00
	CDR120-50	Team Nanotec CDR120 Re-entrant probes - 50 pack Critical Dimension Re-entrant Tip with 120 nm width, 5 nm overhang and 300 kHz resonance.	$19,980.00